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Showing results: 256 - 270 of 298 items found.

  • Modulation Distortion Up To 53 GHz

    S95070B - Keysight Technologies

    S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.

  • Modulation Distortion Up To 26.5 GHz

    S930702B - Keysight Technologies

    S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 50 GHz

    S930705B - Keysight Technologies

    S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 90 GHz

    S930709B - Keysight Technologies

    S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 13.5 GHz

    S930701B - Keysight Technologies

    S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 125 GHz

    S930712B - Keysight Technologies

    S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 43.5 GHz

    S930704B - Keysight Technologies

    S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To And Beyond 125 GHz

    S930713B - Keysight Technologies

    S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 70 GHz

    S930707B - Keysight Technologies

    S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 8.5 GHz

    S930700B - Keysight Technologies

    S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Production and Laboratory OTDR

    8000 - Photon Kinetics

    The 8000 OTDR is the first of a new generation of OTDRs that has been designed specifically for optical fiber and cable test applications. Its revolutionary "performance first" optical design delivers unsurpassed optical performance, and its MS Windows operating system facilitates integration of the OTDR into manufacturing networks. These features, combined with unique data acquisition capabilities, significantly reduce the time associated with many aspects of the OTDR measurement process, making it possible for fiber and cable manufacturers to increase production output and reduce manufacturing costs.

  • Software AndSoftware Drivers

    Advanced Power Designs, Inc.

    Advanced Power Designs is the first to introduce programmable DC power supplies on dual C-Size VXI card formats. Designed specifically for easy integration into new VXI automatic test systems, these state-of-the-art power supplies are fully compliant with all VXI specifications for direct installation into any standard C-Size VXI card cage. They can even be purchased with LABVIEW, LABWINDOWS, CVI or HPVEE Graphical User Interfaces*, and a fully integrated command and control software program written for the National Instruments MXI I/O. protocol.

  • Line Scan Camera

    Piranha4 - Teledyne DALSA

    The Piranha4 cameras offer advanced features such as sub-pixel spatial correction, areas of interest (up to 4 at a time) to reduce data processing and simplify cabling, as well as dual-line area mode to double line rate, HDR mode, shading and lens correction. The Piranha4 is built for the real world with features to ease system integration. The advanced GenICam compliant user interface makes it easy to set up and control camera parameters such as exposure control, FFC, white balance, gain, test patterns, diagnostics and more.

  • MPI SiPH Probe Systems

    MPI Advanced Semiconductor Test

    MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE

  • Analog

    Microchip Technology Inc.

    Create complete systems while streamlining your development process and reducing your design risk. We design our mixed-signal, linear, interface and power products for seamless integration with our extensive portfolio of microcontrollers, digital signal controllers, microprocessors and FPGAs. Well-known for our thorough documentation, we provide parts that work on the bench the same way they’re described on paper. We also provide evaluation boards to demonstrate functionality, an intuitive Integrated Development Environment (IDE), simulation software and other design resources to create a rapid design, prototype and test environment for all aspects of your system design.

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